Due to the outbreaks and continuing impact of the
COVID-19 pandemic in Harbin recently, the organizing committee decide to
postpone the conference SRSE Oct. 22-24 to Nov.
26-28. This was a difficult decision, considering the safety
and well-being of participants, following the governments' epidemic defense
We are planning to held the conference both online and offline still, and will work hard to provide a high quality alternative that allows the exchange of community's latest research and ideas.
We are pleased to announce that The 3rd International Conference on System Reliability and Safety Engineering (SRSE 2021) is to be held in Harbin, China on October 22-24, 2021 November 26-28, 2021. It will be held in conjunction with the annual meeting of SESC Systems Reliability Engineering Technical Committee (SESC). The conference is sponsored by National University of Singapore, Singapore, Harbin Institute of Technology, China, SESC Systems Reliability Engineering Technical Committee, China, co-sponsored by Beihang University, China, City University of Hong Kong, China, Rutgers University, USA, and organized by Institute of Reliability in Electrical Apparatus and Electronics, China.
SRSE is an annual event where you will meet and network with researchers in system reliability and safety engineering and others who are interested in the latest techniques in the field of reliability engineering. On behalf of the organizing committee, we warmly invite you to take part in the conference. With your participation and contribution, together, we shall advance the state-of-the-art in the field of system reliability and safety techniques and their applications.
All submissions will be peer reviewed by experts. The outcomes of the review result will be known in 15 to 20 days.
Accepted and presented papers will be published by SRSE conference proceedings. Published papers are expected to be included in IEEE Xplore, and indexed by EI Compendex, Scopus and other academical databases etc.
Quality and Reliability Engineering International (QREI)
Edited By: Aarnout C. Brombacher, Douglas C. Montgomery and Loon Ching Tang
Guest Editors: Jun Yang, Lijuan Shen, Qingqing Zhai
Online ISSN: 1099-1638
Impact Factor: 2.885
Indexing Information: SCIE, EI Compendex, SCOPUS, etc.
© SRSE 2019-2021 | Harbin, China | Email: firstname.lastname@example.org