Special Session XI

Accelerated Reliability Testing, Validation, and Evaluation Methods
加速可靠性试验、验证与评估技术

With the rapid advancement of modern industrial technology, the demands for product lifespan and reliability have become increasingly rigorous. Conducting accelerated tests under accelerated stress conditions has emerged as a crucial method to evaluate product lifespan and reliability. Nonetheless, such tests encounter limitations in terms of "sample size, time, and cost." The interplay of multiple stresses and the discrepancies between laboratory settings and real-world usage environments pose significant challenges for the validation and assessment of product reliability through accelerated stress testing. This issue has garnered attention from both industry and academia. Consequently, this special session delves into the forefront of theories and methodologies within the realm of accelerated reliability testing, verification, and evaluation. The goal is to collaboratively investigate innovative approaches, strategies, and practical sub-project examples to tackle the aforementioned challenges, thereby offering valuable insights for addressing issues pertinent to both industry and academia.

随着现代工业技术的快速发展，对产品寿命与可靠性的要求越来越高。采用加速应力开展加速试验成为考核产品寿命与可靠性的重要方式，但面临“样本量、时间、与成本”的局限，多应力耦合、实验室环境与使用环境的差异，使得采用加速应力进行产可靠性验证与评估面临诸多挑战，成为工业界和学术界共同关注的热点、难点问题。因此，本专题聚焦加速可靠性试验、验证与评估领域的前沿理论与方法，共同探讨解决上述难题的新方法、新策略以及分项实践案例，为解决工业界和学术界难题提供一些思路。

Chair: Yongquan Sun, Institute of Sensor and Reliability Engineering, Harbin University of Science and Technology, China

Yongquan Sun received the B.S. degree in mechanical engineering from Shandong University of Technology, Zibo, China, in 2005, and the M.S. degree and Ph.D. degree in instrument science and technology from Harbin University of Science and Technology, Harbin, China, in 2008 and 2011, respectively. He is a Professor with the School of Measurement Technology and Communication Engineering, Harbin University of Science and Technology, Harbin, China. From 2013 to 2015, he serviced Commercial Aircraft Corporation of China as a Postdoctor. From 2017 to 2019, he has been a Visiting Scholar at the Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, Maryland, USA. His main research interests are complex system reliability and maintainability, failure mechanism for electronic devices, and PHM. He has published over 60 academic journal and conference papers.

Chair: Jia Qi, Institute of Sensor and Reliability Engineering, Harbin University of Science and Technology, China

Jia Qi received the B. S. degree in measurement and control technology and instrument from Yantai University, Yantai, China, in·2010, and the·M.S. degree and Ph.D. degree in instrument science and technology from Harbin University of Science and Technology, Harbin, China, in·2014 and·2019, respectively. She is a Lecturer with the School of Measurement Technology and Communication Engineering, Harbin University of Science and Technology, Harbin, China. Her main research interests are complex system reliability, electronic device reliability. She has published over 20 academic journal and conference papers.

 Submission Portal

If you are interested in the special session, please submit your paper or abstract here
https://www.zmeeting.org/submission/srse2025 and choose special session 11.

For any questions, please mail the organizers or conference secretary srse@sciei.org.