Integrated Physics-informed and Data-driven Approaches for System Degradation Modeling, Reliability Analysis and Maintenance Planning
Degradation modeling, reliability analysis and maintenance planning are crucial in the design and management of complex systems. While many efforts have been dedicated to the development and application of advanced statistical data-driven methods in system design and management, there is also a recognition of the value of incorporating physical information, such as physics-of-failure models, domain knowledge, and underlying system behaviors. The purpose of this special session is to discuss how to develop approaches which integrate physical information and field data to support system degradation modeling, reliability analysis and maintenance planning and how the integrated approaches can enhance the degradation modeling, reliability analysis and maintenance planning of systems.
Related topics: Some topics that are relevant may include, but are not limited to: accelerated degradation test; failure mechanism analysis; reliability evaluation; stochastic degradation modeling; physics-of-failure modeling; physics-informed degradation modeling, prognostics; maintenance planning.
Chair: Biao Lu, Nanjing University of Aeronautics and Astronautics, China
Biao Lu is currently an assistant professor with the Department of management science and engineering, College of Economic and Management, Nanjing University of Aeronautics and Astronautics. He received his doctoral degree in mechanical engineering in 2019 from Shanghai Jiao Tong University, China. He is now a visiting scholar with the Department of Industrial Systems Engineering and Management, National University of Singapore, supervised by Prof. Ye Zhisheng. His research interests include reliability evaluation, maintenance optimization, and their applications in manufacturing systems. He is currently the author of more than 20 journal papers in the field of reliability and maintenance engineering. (E-Mail: email@example.com)
Chair: Yifan Hu, Harbin Institute of Technology, China
Yifan Hu is currently pursuing the Ph.D. degree with the School of Electrical Engineering and Automation, Harbin Institute of Technology, China. Now, he is also a Visiting Research Scholar with the Department of Industrial Systems Engineering and Management, National University of Singapore. His current research interests include degradation modeling, reliability evaluation and health management for power electronic systems. He has published in peer-reviewed journals including Reliability Engineering & System Safety, IEEE Transactions on Instrumentation and Measurement, Microelectronics Reliability, etc. (E-Mail: firstname.lastname@example.org)
胡义凡，博士就读于哈尔滨工业大学电气工程及自动化学院，目前在新加坡国立大学工业工程与系统管理系访学。主要研究方向为电力电子系统退化建模、可靠性评估与健康管理。已在Reliability Engineering & System Safety, IEEE Transactions on Instrumentation and Measurement, Microelectronics Reliability等国际知名期刊发表多篇论文。
If you are interested in the special
session, please submit your paper or abstract here
https://www.zmeeting.org/submission/srse2023 and choose special session 5.
For any questions, please mail the organizers or conference secretary email@example.com.
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