Special Session VII

Model-based Failure Mechanism Analysis and Reliability Evaluation for Electronic Devices and Systems
基于模型的电子器件与系统失效机理分析和可靠性评价

In the context of new energy, the role of electronic devices and systems have become increasingly prominent in various fields, such as the aviation, aerospace, navigation. With the continuous improvement of the complexity and scale of electronic systems, and the iteratively developing of the critical electronic devices, conventional reliability analysis methods based on mathematical statistics and logical deduction can no longer meet the design requirements of the high-reliability, low-cost electronic systems. One side, employing dynamic equations and digital simulations among other methods, the failure mechanisms of electronic devices can be analyzed and the evolution patterns of accumulative physical damage can be revealed. Furthermore, by applying advanced modeling technologies such as digital twins and artificial intelligence, the performance evolution of electronic systems and critical components in complex environments can be more accurately described, thereby realizing model-based reliability weakness analysis, fault diagnosis, and fault prognosis. This special session aims to share state-of-art research results in the field, thus further promoting the practical applications.

Related topics: Some topics that are relevant may include, but are not limited to: reliability evaluation; digital twin modeling; physics-of-failure modeling; reliability prediction modeling; model-based fault diagnosis; model-based fault prognosis.

新能源背景下，各类电子系统在航空、航天、船舶等各领域发挥的作用愈发凸显。随着电子系统复杂度与规模化不断提升，关键核心器件不断迭代发展，基于数理统计和逻辑推演的传统可靠性分析方法已难以满足电子系统高可靠、低成本正向设计需求。一方面，利用动力学方程、数字化仿真等手段可以分析电子器件失效机理，并揭示物理损伤演化规律；另一方面借助数字孪生、人工智能等先进建模技术，可以更为准确描述电子系统及其关键核心器件在复杂环境下的性能变化，进而实现基于模型可靠性薄弱环节分析、故障诊断与预测。本专题旨在分享基于模型的电子系统可靠性分析方向的前沿研究成果，促进相关成果的工程应用。

相关主题包括但不限于：数字孪生建模；失效物理建模；可靠性预计建模；基于模型的故障诊断；基于模型的故障预测。

Chair: Cen Chen, Harbin Institute of Technology, China

Cen Chen is currently an associated professor with the department of electrical engineering, Harbin Institute of Technology, and the assistant director of the Reliability Institute for Electric Apparatus and Electronics. He is also the SESC Systems Reliability Engineering Technical Committee Member. He received his doctoral degree in electrical engineering in 2019 from Harbin Institute of Technology. He was a visiting scholar with the CALCE Center, University of Maryland, College Park, from Sep. 2017 to Oct. 2018. His research interests include reliability prediction, fault diagnosis and prognosis for electronic devices and systems. (E-Mail: macchan_hit@sina.com)

陈岑，哈尔滨工业大学电气学院副教授，电器与电子可靠性研究所所长助理，中国系统工程学会系统可靠性工程分委会委员。2019年博士毕业于哈尔滨工业大学电气工程专业，曾于2017年9月至2018年10月在美国马里兰大学CALCE中联合培养。主要研究方向为电子系统可靠性预计、故障诊断与健康管理。

Chair: Xuejiao Du, Harbin Engineering University, China

Xuejiao Du is currently an associated professor with the college of aerospace and civil engineering, Harbin Engineering University, and the deputy director of the aerospace engineering department. She received the PhD degree in Mechanical Engineering from Jilin University, China, in 2018. She was an exchange student at the Mechanical Engineering Informatics and Virtual Product Development Research Group from the Vienna University of Technology (TU Wien) in 2017. She was also a visiting scholar with the Center for Advanced Life Cycle Engineering, University of Maryland, USA, in 2018. Her main research focuses on fault diagnostics, prognostics and health management of complex electromechanical systems. (E-Mail: duxuejiao@hrbeu.edu.cn)

Chair: Hao Niu, China Electronic Product Reliability and Environmental Testing Research Institute, China

Hao Niu received the Ph.D. degree in electrical engineering in 2020 from Harbin Institute of Technology, China. He was also a guest PhD student with the Department of Energy Technology, Aalborg University, from September 2016 to October 2017. He currently works at National Key Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component, China Electronic Product Reliability and Environmental Testing Research Institute from 2021, as a senior engineer. His research interests include acceleration test, degradation modeling and reliability evaluation for electronic devices and system.(E-Mail: niuh@ceprei.com)

牛皓，高级工程师，2020年在哈尔滨工业大学获电气工程专业博士学位，曾于2016年9月-2017年10月在丹麦奥尔堡大学能源系联合培养博士生。目前就职于工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室。主要研究方向为电子设备加速试验、退化建模、可靠性评估。

 Submission Portal

If you are interested in the special session, please submit your paper or abstract here
https://www.zmeeting.org/submission/srse2025 and choose special session 7.

For any questions, please mail the organizers or conference secretary srse@sciei.org.